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Technical Information Page

T E C H N I C A L   I N F O R M A T I O N


At Microtek Laboratories , we provide answers to tough manufacturing questions.  Our technical knowledge and hands-on experience is recognized globally as second to none. Microtek's commitment to provide technical information and examples will help ensure that quality is maintained throughout all your manufacturing processes.


CAF Testing


As spacing and part sizes on PCB’s decrease, requirements for conductive anodic filament (CAF) and electrochemical migration resistance (ECM) testing are becoming more critical. Microtek Laboratories specializes in this very involved and increasingly required test procedure and would like to take this opportunity to increase your familiarity with the complexities and test methods. We are now making available our comprehensive article / technical paper which was published in PC FAB's April 2002 Edition. Use the following link to download the article:

View using Adobe Acrobat Reader  CAF Testing, Setup & Procedures  

We hope you find it both insightful and informative as you will undoubtedly encounter an increased demand for this type of quality test.


For more information regarding Microtek's test capabilities or for general questions, please contact us at 800-878-6601 (US Toll Free) or Click Here for more contact information.
   
Reference Library
As we get latest "HOT" information on the industry we will post it here for download.  Below are links to Adobe Acrobat View using Adobe Acrobat Reader  (.PDF) files which contain information on the issues that are affecting you today.  On the next page, there are links to pages with technical columns, articles, press releases and industry news Microtek is committed to being the source for information about our industry.  If you have a question, please do not hesitate to contact someone on our technical staff.

Circuitree Magazine:
Apr 2008: Gorilla Reliability  
Dec 2007: Quality Needs to Be Stapled to the Board  
Oct 2007: Gadget Safari to Africa  
Aug 2007: It’s Time to End Class Discrimination  
Jun 2007: On the Subject of the Bird Flu and PCB Delamination  
Nov 2004: The Halogen-Free Diet  
Aug 2004: Is Lead-Free Really Free?  
Aug 2004: Seoul Train - Korea's PCB Industry Moves Forward  
July 2004: Raising The Standard - Korea's PCB Industry  
Mar 2003: Joint AD-Venture in China  
Mar 2001: Don't Be a Flex Test Dummy  
Dec 2000: UL is 'Flexing' It's Standards  
Nov 2000: X-Rays & X-Ray Guns  
Jun 2000: An IPC EXPO Diary  
Oct 1999: Taking the Mystery Out of UL  
Jun 1999: What's the Standard  
Jan 1999: The Metric Mile  
Oct 1998: A Little Train(ing) That Could  
Sep 1998: They're Taking My 'Woobie' (MIL-S-13949) Away  
Aug 1998: Bellcore's Last Stand(ard)  
July 1998: UL Survival Guide (Part 3)  
Jun 1998: UL Survival Guide (Part 2)  
Apr 1998: UL Survival Guide (Part 1)  
Mar 1998: CCA & Regional Associations  
Nov 1997: Dinosaurs, PWB's and Survival  
Oct 1997: Do You Have Your MIL-S-13949 Decoder Ring  
Sep 1997: The "Thin & Thick" of Dielectric  
Aug 1997: Testing "Tiny" Holes & "Thin" Dielectrics  
July 1997: Growing Pains  
Jun 1997: It's a Jungle Out There  
Apr 1997: Where Does It Hertz  
Mar 1997: The Meaning of Life  
Feb 1997: Morbid Thoughts From a PWB Coroner  
Jan 1997: Out with IPC-RB-276, In with IPC-6012  
Nov 1996: Permittivity/Dielectric Constant: Do the Math  
Oct 1996: Information Technology  
Sep 1996: Controlled Impedance & Time Domain Reflectometry (TDR) 
Aug 1996: The TLA's of Thermal Analysis  
July 1996: The Microsection: A Work Of Art (part 3)  
Jun 1996: The Microsection: A Work Of Art (part 2)  
May 1996: The Microsection: A Work Of Art (part 1)  
Apr 1996: Intelligent Sampling and Testing  

Printed Circuit Europe:
Sep - Oct 1999: UL Certification: The Route to the US Market  

Presentations:
Controlled Impedance & Time Domain Reflectometry (TDR)  
Highly Accelerated Thermal Shock - (HATS)  

PC FAB Magazine:
Apr 2002: CAF Testing, Setup & Procedures  
Feb 2001: "F" is for Flex  
Test Labs and Quality  
Qualification In A World Without QPL's  

 

 

The MIL Specs

In an effort to more completely server our customer's requests, Microtek is now providing "quick links" to direct resources of specs and information.

The Defense Technical Information Center (DTIC®) serves the DoD community as the largest central resource for DoD and government-funded scientific, technical, engineering, and business related information available today...Learn More

  DTIC Online  
  Search DTIC Online  
  The Defense Technical Information Center (DTIC®)  

 

Report Examples


The Sample Microsectional Report link below will allow you to download an example of a test report that Microtek Laboratories has done, including pictures.  Reports can be E-mailed to you as Adobe Acrobat files (.PDF) which can save you time.  The Plated Through Hole (PTH) Defects link below will allow you to download a .PDF file ( which is rather large) containing PTH pictures with defects in them.

View using Adobe Acrobat Reader  Sample Microsectional Report


View using Adobe Acrobat Reader  Plated Through Hole Defects

 

Testing Artwork


Surface Insulation Resistance:
Surface Insulation Resistance (SIR) testing is a Hot Issue in today's electronic Market, Microtek Labs provides SIR testing services to a variety of specifications (BELLCORE, IPC, J-STD, etc.).  We provide a SIR Gerber format test pattern free to the industry in an effort for standardization.  Please click on the the link below if you would like to download this artwork.  For a complete listing of our Environmental test services, please go to the Capabilities section of our web site.

UL PWB / PCB Test Sample:

Artwork  Artwork Sample Request Form

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